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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
468
Références
824
Proportion d'Open Access
45 %
Actualités du Laboratoire
Mots-Clés
Heat recovery
Algorithm
Accelerated degradation test
Computer vision
Brain
MRI
Virtual reality
Identification
Simulation
Irregularity
Quantum noise
Quadratic assignment problem
Data augmentation
Durability
Graph matching
Stochastic resonance
Image processing
Inverse problems
Complexity
Convolutional neural network
Parameter estimation
Imaging
Prediction
Estimation
Partial differential equations
Performance
Accelerated tests
Data mining
Bayesian inference
Heat transfer
Reliability
Electroencephalography
Interval analysis
Control
Fiabilité
Concrete
Social cognition
Stroke
Numerical simulation
Entropy
Empirical mode decomposition
Deep learning
Correlation
Conjugate gradient method
Aging
Older adults
Timed event graphs
Cognition
Lean manufacturing
Laser speckle contrast imaging
Modeling
Max
Degradation
Max-plus algebra
Réalité virtuelle
Quantum information
Sample entropy
Feature extraction
Epilepsy
Interaction Techniques
Six Sigma
Diagnostic
Thermal modeling
Segmentation
Multiscale entropy
Complex systems
Decoherence
Detection
MATLAB
Bayesian network
Gamma process
Image analysis
Control chart
Machine Learning
Texture
Discrete event systems
Fault detection
State estimation
Microcirculation
Machine learning
COVID-19
Diagnosis
Accelerated testing
Petri nets
Cerebral palsy
Awake surgery
Cycle time
Monitoring
Nonlinear dynamics
Optimisation
Complexité
Bayesian networks
Fault diagnosis
Thermal comfort
Scheduling
Optimization
Classification
Conducted immunity
Degradation process
Inverse problem
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩