A general analytical method for interface normal determination in TEM A general analytical method for interface normal determination in TEM

Rui-Xun Xie (1) , Melvyn Larranaga (2) , Frédéric Mompiou (2) , Nicolas Combe (3) , Wen-Zheng Zhang (1)

1 THU - Tsinghua University [Beijing]
2 CEMES-PPM - Physique de la Plasticité et Métallurgie
3 CEMES - Centre d'élaboration de matériaux et d'études structurales

• We present a general method to determine the interface normal from arbitrary orientations. • We developed a general model of interface projection, including existing methods as special cases. • The method is proved to be robust, efficient, and scalable in different situations. A B S T R A C T This paper presents a new analytical method to determine interface normals from a series of bright/dark field images taken from arbitrary orientations. This approach, based on a general geometrical model of interface projection, provides a generalized formulation of existing methods. It can treat an excessive number of inputs, i.e. orientation conditions. Given 6 or more sets of inputs, even with considerable experimental errors, we prove that this method is still very likely to yield results with satisfactory trueness. The robustness of the method can thus allow its implementation in problems dealing with a large amount of data. We show that this method can also be applied to determine 1D features or to check the planarity of microstructural features.

Mots clés: Transmission Electron Microscopy (TEM); Trace analysis; Interface; Crystallography

Domaines: Mécanique des matériaux [physics.class-ph]; Science des matériaux [cond-mat.mtrl-sci]

Rui-Xun Xie, Melvyn Larranaga, Frédéric Mompiou, Nicolas Combe, Wen-Zheng Zhang. A general analytical method for interface normal determination in TEM A general analytical method for interface normal determination in TEM. Ultramicroscopy, 2020, 215, pp.113009. ⟨10.1016/j.ultramic.2020.113009⟩. ⟨hal-02910108⟩