PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community - Equipe Secure and Safe Hardware Accéder directement au contenu
Communication Dans Un Congrès Année : 2020

PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Résumé

Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF “secure”specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.
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Dates et versions

hal-02999226 , version 1 (17-11-2020)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-02999226 , version 1

Citer

Amir Ali Pour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, et al.. PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. IEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. pp.1-10. ⟨hal-02999226⟩
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