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Communication dans un congrès

Comparative analysis of CML and MOS differential automatic amplitude level control regulators for Built-In-Self-Test applications

Abstract : This paper presents Automatic Amplitude Level Regulators (AALR) as a practical Built-In-Test (BIST) and demonstrates its application for on-chip testing and local Calibration of integrated RF blocks. The proposed circuit performs full-wave rectification and generates a dc voltage proportional to the amplitude of an RF signal over a wide frequency range. Both CML and MOS RF AALR are designed and fabricated using NXP-Semiconductors advanced BiCMOS technology process. Very low area occupation with low power consumption are demonstrated for a wide-range of RF input signal power. Digitally controlled bits are introduced for scalable amplitude-level adjustment and control. Measurements show that fabricated RF test devices demonstrate detection dynamic range of 21 dB from 25 MHz to 5 GHz. Advantages and limitations of designed CML and MOS RF regulators are drawn based on careful correlation analysis between simulations and measurement results.
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Communication dans un congrès
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https://hal-unilim.archives-ouvertes.fr/hal-00631587
Contributeur : Véronique Maury <>
Soumis le : mercredi 12 octobre 2011 - 17:10:49
Dernière modification le : vendredi 14 février 2020 - 11:34:04

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Bilal El Kassir, S. Wane, Bernard Jarry, Michel Campovecchio. Comparative analysis of CML and MOS differential automatic amplitude level control regulators for Built-In-Self-Test applications. IEEE BCTM International Conference on Bipolar/BiCMOS Circuits and Technology, Oct 2010, Austin, United States. pp.228-231, ⟨10.1109/BIPOL.2010.5667996⟩. ⟨hal-00631587⟩

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