Measurements for compact and behavioral models of GaN transistors

Wilfried Demenitroux (1) , Christophe Charbonniaud (1) , Tony Gasseling (1) , Jérôme Chéron (2) , Michel Campovecchio (2) , Raymond Quéré (2)

1 AMCAD ENGINEERING
2 XLIM-C2S2 - C2S2

Domaines: Electronique

Wilfried Demenitroux, Christophe Charbonniaud, Tony Gasseling, Jérôme Chéron, Michel Campovecchio, et al.. Measurements for compact and behavioral models of GaN transistors. Workshop "Circuits and GaN Technologies", Microwave & RF, Apr 2012, Versailles, France. ⟨hal-00911568⟩