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Article Dans Une Revue Optics Communications Année : 2005

Electrooptic phenomena in guest-host PMMA-SiC nanocrystals


Electro-optic (EO) phenomena are measured in electrically poled films (0.5 μm) based on large-sized SiC nanocrystallites (nc-SiC) as chromophores and polymethyl-methacrylate (PMMA) as host matrices. Both linear electro-optic (LEO) and quadratic coefficients are obtained, and, for nc-SiC contents ranging from 1% to 3% by weight units, the largest achieved effective LEO coefficient is found close to 26 pm/V at λ = 0.633 μm. Comparison with the electrically active host matrix of poly(vinyl-carbazole) (PVK) shows that the polarization at the nc-SiC boundaries with the polymer play a crucial role on the EO phenomena. Moreover, the relative interface area between the polymer and the SiC nanocrystallites contributes critically to the observed electro-optic effects.

Dates et versions

hal-00916056 , version 1 (09-12-2013)



Johann Bouclé, Abdelhadi Kassiba, I.V. Kityk, Malgorzata Makowska-Janusik, J. Sanetra, et al.. Electrooptic phenomena in guest-host PMMA-SiC nanocrystals. Optics Communications, 2005, 246, pp.415-420. ⟨10.1016/j.optcom.2004.11.004⟩. ⟨hal-00916056⟩
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