Calibrated oscilloscopic system for RF time-domain characterization of non-linear devices

Kassem El-Akhdar; Guillaume Neveux; Denis Barataud; Jean-Michel Nebus

Calibrated oscilloscopic system for RF time-domain characterization of non-linear devices

Kassem El-Akhdar ^{1, *} Guillaume Neveux ¹ Denis Barataud ¹ Jean-Michel Nebus ¹

* Auteur correspondant

1 XLIM-C2S2 - C2S2

XLIM - XLIM

Abstract : This paper proposes a fully calibrated four channel high sampling rate oscilloscopic system based on the use of Track and Hold Amplifiers. The system achieves a high equivalent sampling rate (up to 1THz) using coherent interleaved sampling principle. An accurate calibration procedure allows a 10 kHz resolution over a 3 GHz bandwidth is applied. The capabilities of the system are presented and validated by characterizing a band-pass filter and an S-band 50 W GaN high power broadband amplifier under wideband CW pulsed signal excitation. S-parameters and power characteristics measurements are also presented. The fully calibrated system has the capability to give an accurate visualization of time-domain distortions of input/output voltage and current waveforms within the pulse. It also allows the determination of rising and falling transitions times of the pulse.

Keywords : non linear devices RF time-domain characterization instrumentation wideband measurement THA non linear devices.

Type de document :

Communication dans un congrès

Domaine :

Sciences de l'ingénieur [physics]

Liste complète des métadonnées

https://hal-unilim.archives-ouvertes.fr/hal-00940018
Contributeur : Denis Barataud <>
Soumis le : vendredi 31 janvier 2014 - 11:12:16
Dernière modification le : jeudi 11 janvier 2018 - 06:26:32

Calibrated oscilloscopic system for RF time-domain characterization of non-linear devices

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Calibrated oscilloscopic system for RF time-domain characterization of non-linear devices

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