Dielectric material characterization techniques and designs of high-Q resonators for applications from micro to millimeter-waves frequencies applicable at room and cryogenic temperatures

Jean-Michel Le Floch; Yahoui Fan; Georges Humbert; Qingxiao Shan; Denis Férachou; Romain Bara-Maillet; Michel Aubourg; J.G. Hartnett; Valérie Madrangeas; Dominique Cros; Jean-Marc Blondy; Jerzy Krupka; Michael Tobar

doi:10.1063/1.486746

Dielectric material characterization techniques and designs of high-Q resonators for applications from micro to millimeter-waves frequencies applicable at room and cryogenic temperatures

Jean-Michel Le Floch ¹ Yahoui Fan ¹ Georges Humbert ² Qingxiao Shan ³ Denis Férachou ² Romain Bara-Maillet ¹ Michel Aubourg ⁴ J.G. Hartnett ⁵ Valérie Madrangeas ⁴ Dominique Cros ⁴ Jean-Marc Blondy ² Jerzy Krupka ⁶ Michael Tobar ¹

1 EQuS - ARC Centre of Excellence Engineered Quantum Systems

2 XLIM-PHOTONIQUE - PHOTONIQUE

XLIM - XLIM

3 College of Mechatronics and Automation

4 XLIM-MINACOM - MINACOM

XLIM - XLIM

5 IPAS - Institute for Photonics and Advanced Sensing (IPAS) and the School of Chemistry and Physics

6 WARSAW UNIVERSITY OF TECHNOLOGY - Institute of Microelectronics and Optoelectronics, Department of Electronics, Warsaw University of Technology

Abstract : Dielectric resonators are key elements in many applications in micro to millimeter wave circuits, including ultra-narrow band filters and frequency-determining components for precision frequency synthesis. Distributed-layered and bulk low-loss crystalline and polycrystalline dielectric structures have become very important for building these devices. Proper design requires careful electromagnetic characterization of low-loss material properties. This includes exact simulation with precision numerical software and precise measurements of resonant modes. For example, we have developed the Whispering Gallery mode technique for microwave applications, which has now become the standard for characterizing low-loss structures. This paper will give some of the most common characterization techniques used in the micro to millimeter wave regime at room and cryogenic temperatures for designing high-Q dielectric loaded cavities.

Type de document :

Article dans une revue

Domaine :

Sciences de l'ingénieur [physics] / Electromagnétisme

Liste complète des métadonnées

https://hal-unilim.archives-ouvertes.fr/hal-00967041
Contributeur : Valérie Madrangeas <>
Soumis le : jeudi 27 mars 2014 - 17:31:48
Dernière modification le : vendredi 13 décembre 2019 - 13:18:03

Dielectric material characterization techniques and designs of high-Q resonators for applications from micro to millimeter-waves frequencies applicable at room and cryogenic temperatures

Identifiants

Collections

Citation

Exporter

Métriques

454

Dielectric material characterization techniques and designs of high-Q resonators for applications from micro to millimeter-waves frequencies applicable at room and cryogenic temperatures

Identifiants

Collections

Citation

Exporter

Partager

Métriques

454