Wideband Characterization of Dielectric Material by New Approaches Based on Near Field Microwave Microscopy

Jamal Rammal; Olivier Tantot; Nicolas Delhote; Serge Verdeyme

Communication dans un congrès

Wideband Characterization of Dielectric Material by New Approaches Based on Near Field Microwave Microscopy

Jamal Rammal ¹ Olivier Tantot ¹ Nicolas Delhote ¹ Serge Verdeyme ¹

1 XLIM-MINACOM - MINACOM

XLIM - XLIM

Type de document :

Communication dans un congrès

Domaine :

Sciences de l'ingénieur [physics] / Electromagnétisme

Liste complète des métadonnées

https://hal-unilim.archives-ouvertes.fr/hal-00977970
Contributeur : Olivier Tantot <>
Soumis le : vendredi 11 avril 2014 - 18:42:28
Dernière modification le : jeudi 11 janvier 2018 - 06:26:39

Wideband Characterization of Dielectric Material by New Approaches Based on Near Field Microwave Microscopy

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Wideband Characterization of Dielectric Material by New Approaches Based on Near Field Microwave Microscopy

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