Jamal Rammal, Olivier Tantot, Nicolas Delhote, Serge Verdeyme. Near-field microwave microscopy for the characterization of dielectric materials.
International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2014, pp.1 - 6.
⟨10.1017/S175907871400110X⟩.
⟨hal-01060283⟩ 
