Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices

Denis Barataud (1) , Kassem El Akhdar (1) , Lotfi Ayari (2) , Guillaume Neveux (1) , Said Farah (1)

1 XLIM-SRF - Systèmes RF
2 XLIM - XLIM

A time-domain (TD) measurement system that improves dynamic losses for pulsed radiofrequency characterisation of non-linear devices is presented. This system allows the measurement of voltage and current TD waveforms at very high sampling rate at both ports of the device under test. The fully calibrated system is used to accurately characterise transients in a 40 W GaN wideband high power amplifier under pulsed signal excitation.

Mots clés: radiofrequency power amplifiers; wide band gap semiconductors; gallium compounds; III-V semiconductors; measurement systems

Domaines: Sciences de l'ingénieur [physics]; Electronique; Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique

Denis Barataud, Kassem El Akhdar, Lotfi Ayari, Guillaume Neveux, Said Farah. Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices. Electronics Letters, 2016, 52 (10), pp.839 - 840. ⟨10.1049/el.2016.0174⟩. ⟨hal-01706879⟩