Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices

Denis Barataud; Kassem El Akhdar; Lotfi Ayari; Guillaume Neveux; Said Farah

doi:10.1049/el.2016.0174

Article dans une revue

Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices

Denis Barataud ¹ Kassem El Akhdar ¹ Lotfi Ayari ² Guillaume Neveux ¹ Said Farah ¹

1 XLIM-SRF - Systèmes RF

XLIM - XLIM : SRF

2 XLIM - XLIM

Abstract : A time-domain (TD) measurement system that improves dynamic losses for pulsed radiofrequency characterisation of non-linear devices is presented. This system allows the measurement of voltage and current TD waveforms at very high sampling rate at both ports of the device under test. The fully calibrated system is used to accurately characterise transients in a 40 W GaN wideband high power amplifier under pulsed signal excitation.

Keywords : wide band gap semiconductors gallium compounds III-V semiconductors measurement systems radiofrequency power amplifiers

Type de document :

Article dans une revue

Domaine :

Sciences de l'ingénieur [physics] / Electronique

Sciences de l'ingénieur [physics] / Micro et nanotechnologies/Microélectronique

Liste complète des métadonnées

https://hal-unilim.archives-ouvertes.fr/hal-01706879
Contributeur : Denis Barataud <>
Soumis le : lundi 12 février 2018 - 12:43:27
Dernière modification le : mardi 28 avril 2020 - 09:28:02

Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices

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Improvement of dynamic losses in pulse CW characterisation of non-linear RF devices

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