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Article Dans Une Revue Journal of Applied Crystallography Année : 1995

The influence of cylindrical geometry on X-ray stress tensor analysis. I. General formulation.

Résumé

Stress analysis by X-ray diffraction, usually performed on a specimen with plane geometry, becomes very dificult on more complex surfaces. A model is proposed to calculate the six independent components of the stress tensor cylindrical symmetry. The mathematical approach described highlights two distinct effects that modify values of measured strain by X-ray diffraction, a rotation effect and a translation effect. The X-ray absorption by the material is taken into consideration and two models are proposed to undertake the mathemetical processing on thick materials and thin layers. It is equally possible to take into account, for example, crystallographic texture and experimental features as (psi phi) oscillations. Examples and applications will be given in paper II.
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Dates et versions

hal-01880510 , version 1 (25-09-2018)

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  • HAL Id : hal-01880510 , version 1

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Manuel François, Bernard Dionnet, Jean Michel Sprauel, Françoise Nardou. The influence of cylindrical geometry on X-ray stress tensor analysis. I. General formulation.. Journal of Applied Crystallography, 1995, 28, pp.761-767. ⟨hal-01880510⟩
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