On-wafer time-domain measurement of pulse-to-pulse stability and multi-tones load-pull characterization of linearity to improve the nonlinear modeling of thermal/trapping effects in power GaN HEMTs for radar and telecom applications

Denis Barataud (1) , Michel Campovecchio (1) , Audrey Martin (1) , Pierre Medrel (1) , Neveux Guillaume (1) , Michel Prigent (1) , Jean-Christophe Nallatamby (1) , Raymond Quéré (1) , Sylvain Laurent (1) , Jean-Pierre Teyssier (1)

1 XLIM-SRF - Systèmes RF

Domaines: Micro et nanotechnologies/Microélectronique; Electronique

Denis Barataud, Michel Campovecchio, Audrey Martin, Pierre Medrel, Neveux Guillaume, et al.. On-wafer time-domain measurement of pulse-to-pulse stability and multi-tones load-pull characterization of linearity to improve the nonlinear modeling of thermal/trapping effects in power GaN HEMTs for radar and telecom applications. EuMW 2018, Sep 2018, MAdrid, Spain. ⟨hal-02013184⟩