Denis Barataud, Michel Campovecchio, Audrey Martin, Pierre Medrel, Neveux Guillaume, et al.. On-wafer time-domain measurement of pulse-to-pulse stability and multi-tones load-pull characterization of linearity to improve the nonlinear modeling of thermal/trapping effects in power GaN HEMTs for radar and telecom applications.
EuMW 2018, Sep 2018, MAdrid, Spain.
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