Continuous time-domain RF waveforms monitoring under overdrive stress condition of AlGaN/GaN HEMTs

A. Benvegnù (1) , S. Laurent (1) , M. Meneghini (2) , R. Quere (3) , J.-L. Roux (4) , E. Zanoni (2) , Denis Barataud (1)

1 XLIM-SRF - Systèmes RF
2 DEI - Dipartimento di Ingegneria de l'Informazione [Padova]
3 Equipe SAPHIHR (LNC - U1231)
4 CNES - Centre National d'Études Spatiales [Toulouse]

Domaines: Sciences de l'ingénieur [physics]; Micro et nanotechnologies/Microélectronique; Sciences de l'ingénieur [physics]; Electronique

A. Benvegnù, S. Laurent, M. Meneghini, R. Quere, J.-L. Roux, et al.. Continuous time-domain RF waveforms monitoring under overdrive stress condition of AlGaN/GaN HEMTs. Microelectronics Reliability, 2016, 64, pp.535-540. ⟨10.1016/j.microrel.2016.07.122⟩. ⟨hal-02552061⟩