M. Ben-Sassi, G. Neveux, Denis Barataud. Ultra-Fast (13ns) Low Frequency/Microwave Transient Measurements, Application to GaN Transistors Characterization of Pulse to Pulse Stability.
2019 IEEE/MTT-S International Microwave Symposium - IMS 2019, Jun 2019, Boston, United States. pp.1383-1386,
⟨10.1109/MWSYM.2019.8700727⟩.
⟨hal-02556600⟩