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Article Dans Une Revue Journal of Applied Crystallography Année : 2001

Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis

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Résumé

Profile fitting procedures associated with integral breadth studies and Fourier analysis are applied to the study of the complex Bi-containing layered perovskite SrBi 2 Nb 2 O 9 . Strong line broadening anisotropy is evidenced. Both `size' and `strain' effects contribute to the observed width. However, `size' broadening along the [00 l ] direction is essentially caused by stacking faults. The coherently diffracting domain sizes are deduced from Fourier analysis of the diffraction patterns and a rough estimate of the mean distance between faults is given. Thermal annealing significantly decreases the stacking fault density.

Dates et versions

hal-03482631 , version 1 (16-12-2021)

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Citer

Alexandre Boulle, C. Legrand, René Guinebretière, J. Mercurio, A. Dauger. Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis. Journal of Applied Crystallography, 2001, 34 (6), pp.699-703. ⟨10.1107/S0021889801011700⟩. ⟨hal-03482631⟩
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