Arrêt de service lundi 11 juillet de 12h30 à 13h : tous les sites du CCSD (HAL, Epiciences, SciencesConf, AureHAL) seront inaccessibles (branchement réseau à modifier)
Accéder directement au contenu Accéder directement à la navigation
Article dans une revue

Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis

Abstract : Profile fitting procedures associated with integral breadth studies and Fourier analysis are applied to the study of the complex Bi-containing layered perovskite SrBi 2 Nb 2 O 9 . Strong line broadening anisotropy is evidenced. Both `size' and `strain' effects contribute to the observed width. However, `size' broadening along the [00 l ] direction is essentially caused by stacking faults. The coherently diffracting domain sizes are deduced from Fourier analysis of the diffraction patterns and a rough estimate of the mean distance between faults is given. Thermal annealing significantly decreases the stacking fault density.
Type de document :
Article dans une revue
Liste complète des métadonnées

https://hal-unilim.archives-ouvertes.fr/hal-03482631
Contributeur : BEATRICE DERORY Connectez-vous pour contacter le contributeur
Soumis le : jeudi 16 décembre 2021 - 10:13:42
Dernière modification le : samedi 26 mars 2022 - 04:29:19

Lien texte intégral

Identifiants

Collections

Citation

Alexandre Boulle, C. Legrand, René Guinebretière, J. Mercurio, A. Dauger. Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis. Journal of Applied Crystallography, International Union of Crystallography, 2001, 34 (6), pp.699-703. ⟨10.1107/S0021889801011700⟩. ⟨hal-03482631⟩

Partager

Métriques

Consultations de la notice

10