Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis

Alexandre Boulle (1, 2) , Caroline Legrand (3) , René Guinebretière (1) , Jean-Pierre Mercurio (3) , Alain Dauger (3)

1 SPCTS-AXE3 - Axe 3 : organisation structurale multiéchelle des matériaux
2 IRCER-AXE3 - IRCER - Axe 3 : organisation structurale multiéchelle des matériaux
3 SPCTS - Science des Procédés Céramiques et de Traitements de Surface

Profile fitting procedures associated with integral breadth studies and Fourier analysis are applied to the study of the complex Bi-containing layered perovskite SrBi 2 Nb 2 O 9 . Strong line broadening anisotropy is evidenced. Both `size' and `strain' effects contribute to the observed width. However, `size' broadening along the [00 l ] direction is essentially caused by stacking faults. The coherently diffracting domain sizes are deduced from Fourier analysis of the diffraction patterns and a rough estimate of the mean distance between faults is given. Thermal annealing significantly decreases the stacking fault density.

Domaines: Matériaux; Matériaux

Alexandre Boulle, Caroline Legrand, René Guinebretière, Jean-Pierre Mercurio, Alain Dauger. Planar faults in layered Bi-containing perovskites studied by X-ray diffraction line profile analysis. Journal of Applied Crystallography, 2001, 34 (6), pp.699-703. ⟨10.1107/S0021889801011700⟩. ⟨hal-03482631⟩