X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Thin Solid Films Année : 2001

X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films

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hal-03596492 , version 1 (03-03-2022)

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Alexandre Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger. X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films. Thin Solid Films, 2001, 391 (1), pp.42-46. ⟨10.1016/S0040-6090(01)00975-0⟩. ⟨hal-03596492⟩

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