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Article Dans Une Revue European Physical Journal: Applied Physics Année : 2000

Transmission electron microscopy of NdNiO 3 thin films on silicon substrates

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hal-03597961 , version 1 (04-03-2022)

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P. Laffez, R. Retoux, P. Boullay, M. Zaghrioui, P. Lacorre, et al.. Transmission electron microscopy of NdNiO 3 thin films on silicon substrates. European Physical Journal: Applied Physics, 2000, 12 (1), pp.55-60. ⟨10.1051/epjap:2000171⟩. ⟨hal-03597961⟩
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