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Article Dans Une Revue Journal of Materials Science: Materials in Electronics Année : 1997

A TEM study of grain boundaries in internal boundary layer capacitors based on donor-doped (Sr, Ca) TiO3 ceramics

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Résumé

Donor-doped (Sr, Ca)TiO3 ceramics, either oxidized or infiltrated by Bi2O3 and Bi2O3-PbO molten mixtures, have been studied using a transmission electron microscope equipped with EDX facilities. Grain boundary morphologies of these different materials are investigated. In oxidized samples, grain surfaces exhibit a chemical contrast, interpreted as the result of a TiO2 segregation that occurs during the sintering stage. Moreover, the in-detail characterization of infiltrated specimens reveals that intergranular regions present a facies strongly influenced by the type of mixture used. During the infiltration step, grains are slightly dissolved by molten oxides and Pb noticeably enhances this process.

Dates et versions

hal-03625879 , version 1 (04-04-2022)

Identifiants

Citer

F Poignant, G Trolliard, P Abelard. A TEM study of grain boundaries in internal boundary layer capacitors based on donor-doped (Sr, Ca) TiO3 ceramics. Journal of Materials Science: Materials in Electronics, 1997, 8 (3), pp.139-146. ⟨10.1023/A:1018533827407⟩. ⟨hal-03625879⟩
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