A novel time domain characterization technique of intermodulation in microwave transistors. Application to the visualization of the distortion of high efficiency power amplifiers

Denis Barataud (1) , Alain Mallet (1) , Jean-Philippe Fraysse (1) , Michel Campovecchio (1) , Jean-Michel Nebus (1) , Jean-Pierre Villotte (1) , J. Verspecht

1 IRCOM - Institut de Recherche en Communications Optiques et Microondes

Domaines: Sciences de l'ingénieur [physics]; Electronique

Denis Barataud, Alain Mallet, Jean-Philippe Fraysse, Michel Campovecchio, Jean-Michel Nebus, et al.. A novel time domain characterization technique of intermodulation in microwave transistors. Application to the visualization of the distortion of high efficiency power amplifiers. IEEE MTT-S International Microwave Symposium on Microwave Theory and Techniques, Jun 1997, Denver, CO, United States. pp. 1687-1690, ⟨10.1109/MWSYM.1997.596747⟩. ⟨hal-01067819⟩