S. van den Berghe, F. Miserque, T. Gouder, B. Gaudreau, M. Verwerft. X-ray photoelectron spectroscopy on uranium oxides: a comparison between bulk and thin layers.
Journal of Nuclear Materials, Elsevier, 2001, 294 (1-2), pp.168-174.
⟨10.1016/S0022-3115(01)00461-5⟩.
⟨hal-03555253⟩