Jean-Pierre Teyssier, Michel Campovecchio, Raphaël Sommet, Portilla Joaquin, Raymond Quéré. A pulsed S-parameters measurement setup for the nonlinear characterization of FETs and bipolar power transistors.
23rd European Microwave Conference, Sep 1993, Madrid, Spain. pp. 489-493,
⟨10.1109/EUMA.1993.336603⟩.
⟨hal-01067054⟩