Electrical transport properties and modelling of electrostrictive resonance phenomena in Ba 2/3 Sr 1/3 TiO 3 thin films

Areski Ghalem 1 Laure Huitema 2 Aurelian Crunteanu 1 Mohamad Rammal 1 Lucian Trupina 3 Liviu Nedelcu 3 Gabriel Banciu 3 Perrine Dutheil 4 Catalin Goldner-Constantinescu 4 Pascal Marchet 5 Frédéric Dumas-Bouchiat 4 Corinne Champeaux 4
1 XLIM-RFEI - RF-ELITE : RF-Electronique Imprimée pour les Télécommunications et l'Energie
XLIM - XLIM : RFEI
2 XLIM-SRF - Systèmes RF
XLIM - XLIM : SRF
3 National Institute for Materials Physics - NIMP (ROMANIA)
4 Axe 2 : procédés de traitements de surface
SPCTS - Science des Procédés Céramiques et de Traitements de Surface
5 SPCTS-AXE3 - Axe 3 : organisation structurale multiéchelle des matériaux
SPCTS - Science des Procédés Céramiques et de Traitements de Surface
Abstract : We present the conduction mechanisms of Ba 2/3 Sr 1/3 TiO 3 thin films integrated in metal-insulator-metal (MIM) capacitors and the modelling of the frequency-dependent electrostrictive resonances (in the 100 MHz-10 GHz domain) induced in the devices upon applying different voltage biases. Au/BST/Ir MIM structures on MgO substrates have been fabricated and, depending on their specific polarization, we highlighted different conduction mechanisms in the devices. Depending on the dc bias polarity, the conduction current across the material shows a space-charge-limited-current behavior under negative polarization, while under positive bias the conduction obeys an electrode-limited Schottky-type law at the Au/ BST interface. The application of an electric field on the device induces the onset of acoustic resonances related to electrostrictive phenomena in the ferroelectric material. We modeled these acoustic 2 resonances over a wide frequency range, by using a modified Lakin model which takes into account the dispersions of acoustic properties near the lower electrode/ thin film interface.
Keywords : Ferroelectrics BST Conduction mechanisms Electrostrictive resonances Interface layer
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Article dans une revue
Journal of Applied Physics, American Institute of Physics, 2016, 120 (18), pp.184101-1-9. 〈10.1063/1.4966942〉
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Contributeur : Aurelian Crunteanu <>
Soumis le : jeudi 10 novembre 2016 - 07:44:20
Dernière modification le : lundi 23 avril 2018 - 00:14:02

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UNILIM | SPCTS-AXE2 | SPCTS-AXE3 | XLIM-RFEI | XLIM-SRF | INC-CNRS | SPCTS | XLIM | IRCER | IRCER-AXE3 | IRCER-AXE2

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Areski Ghalem, Laure Huitema, Aurelian Crunteanu, Mohamad Rammal, Lucian Trupina, et al.. Electrical transport properties and modelling of electrostrictive resonance phenomena in Ba 2/3 Sr 1/3 TiO 3 thin films. Journal of Applied Physics, American Institute of Physics, 2016, 120 (18), pp.184101-1-9. 〈10.1063/1.4966942〉. 〈hal-01394847〉

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