High-frequency characterisation of ferroelectric thin film capacitors and their integration for frequency tunable antennas

Areski Ghalem (1) , Laure Huitema (2) , Aurelian Crunteanu (1) , Mohamad Rammal (2, 1) , Damien Passerieux (3) , Dominique Cros (1) , Thierry Monédière (2) , Valérie Madrangeas (1) , Catalin Constantinescu (4) , Corinne Champeaux (5) , Frédéric Dumas-Bouchiat (4) , Pascal Marchet (5) , Liviu Nedelcu (6) , Lucian Trupina (6) , Gabriel Banciu (6)

1 XLIM-RFEI - RF-ELITE : RF-Electronique Imprimée pour les Télécommunications et l'Energie
2 XLIM-SRF - Systèmes RF
3 XLIM - XLIM
4 Axe 2 : procédés de traitements de surface
5 SPCTS - Science des Procédés Céramiques et de Traitements de Surface
6 National Institute for Materials Physics - NIMP (ROMANIA)

Domaines: Matériaux; Micro et nanotechnologies/Microélectronique; Electromagnétisme

Areski Ghalem, Laure Huitema, Aurelian Crunteanu, Mohamad Rammal, Damien Passerieux, et al.. High-frequency characterisation of ferroelectric thin film capacitors and their integration for frequency tunable antennas. THE 9th INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS, ROCAM 2017, BUCHAREST, ROMANIA, 11-14 JULY 2017 , Jul 2017, Bucarest, Romania. ⟨hal-01568594⟩